Fourfold Multi Hit Delay Line Detector Systems


News:

NEW product launch:
Multi hit DLD (4-fold detector)
 reads above 100 MCPS
 burst rates.

Product launch of our new multi
channel delay line detector
systems

Multi channel Flexi-TDC for
multi hit measurements
available now.

Surface Concept joins
Network of Competence

Surface Concept is now
Surface Concept GmbH

Surface Concept founders won
Innovation Award 2004 BESSY

New USB 2.0 electronics
for all delay line detectors now
available

X-ray delay line detector
successfully commissioned

Surface Concept presents
interchangeable delay line
detector for electron
microscopes

SPECS presents the Surface
Concept delay line detector for
 PHOIBOS analyser

Surface Concept +
10 years foundation
Innovation Rheinland
Pfalz

Fourfold Multi Hit Delay Line Detector Systems

4-quadrant delay line detector for parallel multi hit detection of electrons, ions, UV and X-ray with burst count rates of above 100 MCPS1)

ACU 4.16: 4 independent 4 channel analog pulse processing electronics       

DLD3030_4Q: 4-quadrant meander DLD
on CF 150 vacuum flange

Double USB2.0-TDC: 16 channel time-to-digital converter

DLD3030_4Q with schematic sketch of the  positions of the quadrants. Note the blind gap in the middle of the active area.

Technical features

Fourfold Multi Hit DLD
●  4-quadrant meander2) delay line detector with 87 mm chevron MCP stack

●  UHV design, fitting to CF 150 flange diameter

●  Active detector area of 60 mm x 60 mm (30mm x 30mm per quadrant). Different sizes
   available on request.
   Note: There is a blind gap of < 1mm between the quadrants (see fig. above) which will appear as a “blind” cross
   structure within the images.

●  Up to 4003) pixel for 60 mm detection length with standard readout system

●  Up to 1200 pixel (for 60 mm detection length) possible with 4-fold TDC system (device is
   currently under development and will be available in summer 2009)

● Real parallel detection of 4 hits without any deadtime due to the fourfold design

●  A multi hit resolution of 10 ns per quadrant with a 32-fold memory depth allows theoretically a
   detection of up to 128 hits each 320 ns using the four independent quadrants in parallel
   (corresponds to 400 MCPS, only valid for bursts with long deadtimes in between, not
   reachable in continous operation)1).

● The multi hit resolution of the single quadrants (10 ns each) is always unambiguous due to
     the layout with a single delay length of approx. 9 ns each. This also avoids data redundancy
     problems completely.

●  Linear response due to single event counting

●  Extremely low dark count rate for each quadrant: < 5 cps 

Analog Readout Electronics
●  4 independent 4 channel pulse processing units (preamplifier and
     constant-fraction-discriminator, CFD walk < 50 ps, frequency for pulse convertion > 150
     MHz).

Time-To-Digital-Converter
●  Time measurement via 16 channel time-to-digital-converter (TDC) with
     - internal reading rate of 80 MHz
     - 17 bit time measurement depth
     - 32-fold memory depth for multi hit recognition for each channel with pulse distances of min.
       5.6 ns
     - Time bin resolution: 82 ps (time resolution < 250 ps possible using rayleigh criteria on
       statistical distributions measured on the same image position)
     - FPGA based data processing (calculations of time sums and differences), parallelized for
         the 4 quadrants
     - 2 MByte FIFO for data transfer to USB controller

Data readout and Software
●  Data readout to PC via USB 2.0 driver for Windows® systems

●  USB transfer rate: 32 MByte/s (max.), 28 MByte/s (typ. value for continous operation).
     Depending on the application 2 Byte per event are minimal required for data transfer.    

●  Stand-Alone DLD monitor software

●  Software DLL with user interface description for detector readout by external software

●  LabView® VI interface available

1) The multi hit resolution achieves a max. theoretical detection of up to 128 hits each 320 ns, which corresponds to 400 MCPS. This value is only valid for short bursts of events homogenously distributed over the active area and enough time interval without incoming events (duty cycle; on time interval/ off time interval of about 1/50) for data processing. It is not reachable in continous operation.

2) New lithographically produced meander delaylines have been intruduced for all of our delay line detectors, which hold serveral benefits in comparison to the traditional layout with wire coils delaylines (for further information see our new catalogue for download (4.9 MB)).

3) The both (x and y) directions of the detector/ of each quadrant hold a different number of pixels, due to the intrinsic layout of the meander delay lines.

® Windows is a registered trademark of the Microsoft Corporation, LabVIEW is a registered trademark of National Instruments

 

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