Electron Microscope Detectors
Retractable microchannel plate based delayline detectors for position and time resolved detection of electrons with sub-ns time resolution for Transmission Electron Microscopes.
The delayline detectors are mounted on a retraction mechanism in a shielded housing laid out to fit to the standard camera port of most Transmission Electron Microscopes.
All detectors come as complete packages including analogue readout electronics, time-to-digital converter, software package and optional HV power supply for a plug and play installation and operation.
Flange mounted, MCP based single delayline anode detector with 3-fold SHV and 4-fold SMB feedthroughs and cabling for HV supply and pulse decoupling.
- active area: 40mm in diameter
- pixel no.: 1200 x 1300
- time resolution: <= 300ps
- max. random count rate: >= 5Mcps
- retractable detector in shielded housing
ELECTRONIC COMPONENTS OF DETECTOR PACKAGES
All detector packages include the following electronic components.

Amplifier Constant Fraction Discriminator Unit
Fast pulse processing unit for delayline detectors.
- direct mounting to the signal feedthrough
- 4x amplifiers
- 4x constant-fraction-discriminator

Time-to-Digital Converter
Time measuring electronics with FPGA based integrated DLD readout logic.
- number of stop inputs: 4
- number of start inputs (reference clock): 1
- measurement range: 0ns – 40µs in start-stop operation
- USB3.0 and 1Gbit ethernet interface for data readout
- inputs/outputs for advanced measurement options

High Voltage Power Supply (optional)
2-channel HV supply for the supply of delayline detectors.
- 2 HV channels for supply of MCP stack and DLD anode
- touch display for manual control
- Ethernet interface for external control
- external reference input for floating operation of HV supply and detector