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TIME-OF-FLIGHT SYSTEMS AND COMPONENTS

Time-of-Flight Momentum Microscope with Spin Imaging Option Allows for direct, energy filtered imaging of sample surfaces with an energy resolution of <15meV and parallel imaging of up to 400 energy slices. Sample areas down to a diameter of a few µm can be selected. From these areas, ARPES spectra can be obtained with an acceptance angle of up to +-90° and an angular resolution down to 0.01 Å-1. A parallel imaging Spin Filter is available as an additional option.

Bolt-On Time-
of-Flight
Spectrometer
Upgrade an existing system (e.g. a Scanning Electron Microscope) with an additional Time-of-Flight (ToF) spectrometer for energy filtering of, e.g., secondary electrons. The ToF method provides many energy slices in one shot.

Product variants: