History of the
Surface Concept GmbH
1996
From Idea to Innovation in Time Resolved Spectroscopy
From Idea to Innovation in Time Resolved Spectroscopy
The later founders of Surface Concept GmbH pursued their vision of enabling time-resolved insights in the nanosecond and picosecond range. The first developments in time-resolved electron microscopy and spectroscopy took place at the University of Mainz.
2001
Founding of Surface Concept GbR
Founding of Surface Concept GbR
It all started in 2001 with a small team and a big idea: turning complex detection and analysis tech into something modular, practical, and ready for the future. That was the beginning of Surface Concept GbR – and the foundation for everything that followed.
2002
Introducing the World’s First Picosecond Electron Microscope
Introducing the World’s First Picosecond Electron Microscope
Dr. Andreas Oelsner and Prof. Dr. Gerd Schönhense (both founders of Surface Concept GmbH) successfully developed the world's first picosecond photoemission electron microscope (ToF-PEEM), which was presented to a broad public for the first time in its compact MINI-PEEM version at the Hannover Fair 2002.
2003
Patented Detector Design
Patented Detector Design
The new segmented design of the delay detectors was developed by Dr. Andreas Oelsner (patent DE10335718B4).
2004
Prize for Breakthrough Research
Prize for Breakthrough Research
Dr. Andreas Oelsner and Prof. Dr. Gerd Schönhense were awarded the BESSY Innovation Prize for Synchrotron Radiation in 2004 for the development of time-resolving photoemission electron microscopes.
2005
Converting GbR into Surface Concept GmbH
Converting GbR into Surface Concept GmbH
In 2005, Surface Concept GbR became Surface Concept GmbH as the team and vision kept growing. It is still located in Mainz, in the center of Germany.
2007
Introducing the First Own Time-to-Digital Converter
Introducing the First Own Time-to-Digital Converter
Surface Concept launched its first own Time-to-Digital Converters (TDCs), enabling time-resolved measurements with picosecond precision in a compact design and USB connectivity. Allowing the processing and transfer of high event rates, they quickly became a go-to solution for fast and reliable experimental setups.
2008
A Milestone in Detector Development
A Milestone in Detector Development
That year marked a key milestone: Surface Concept introduced the first Delayline Detector featuring a detector anode based on a lithographically produced meander-structured delayline. This innovation laid the foundation for a new generation of position- and time-sensitive detectors.
2008
Release of the 1D-DLD
Release of the 1D-DLD
The first 1D Delayline Detector (1D-DLD) was introduced, designed for fast and precise line position-resolved detection in hemispherical analyzers.
2008
Selling the First Segmented Delayline Detector
Selling the First Segmented Delayline Detector
Also in 2008, the first Segmented Anode Delayline Detector (DLD-4Q) was launched, marking another big step forward. These detectors feature segmented delayline anodes that significantly improve multi-hit capability while maintaining excellent time and spatial resolution.
2015
Introducing the ToF Momentum Microscope
Introducing the ToF Momentum Microscope
The first Time-of-Flight (ToF) Momentum Microscope was introduced, marking a major step forward in momentum-resolved spectroscopy. Based on a patented design from Max Planck Institut Halle, this novel instrument enabled the simultaneous acquisition of energy, momentum, and spatial information across the full 2π k² emission hemisphere.
2018
Release of the Imaging Spin Detector for the ToF Momentum Microscope
Release of the Imaging Spin Detector for the ToF Momentum Microscope
The Imaging Spin Detector was introduced as an upgrade for the Time-of-Flight Momentum Microscope. The spin imaging is based on a parallel working, patented, Au/Ir spin filter principle.
2019
Trademark Registration for Surface Concept scientific CMOS Camera (ReconFlexTM & nanoFLeyeTM)
Trademark Registration for Surface Concept scientific CMOS Camera
(ReconFlexTM & nanoFLeyeTM)
In 2019, ReconFlexTM, a new line of high-performance CMOS cameras, was introduced. Specially developed for scientific applications, these cameras feature integrated single-particle recognition by a patented real-time blob mode coordinate detection and a super-resolution algorithm.
